Battery Incipient Fault Digital Twin (BIF-DT)
The practical application of incipient fault detection in Battery Energy Storage Systems (BESS) is challenged by complex fault characteristics, limited data, and the need for scalable real-time processing. Early faults like SEI growth are difficult to detect with conventional methods but critical for preventing catastrophic failures.
In response, we have developed the Battery Incipient Fault Digital Twin (BIF-DT), an integrated framework combining an electrochemical model and a physics-based circuit model. This validated platform enables high-fidelity, efficient simulation of internal processes for accurate early fault detection. Looking ahead, it holds strong promise for improving BESS reliability and safety, with future work focusing on enhancing its scalability and real-time capabilities for deployment as a proactive diagnostic tool in commercial and grid-scale systems.
Publications:
[1] Ziqi Wang and Mo-Yuen Chow, “Battery Modeling of SEI and Metal Dendrite Growth: A Transmission Line Circuit Framework with Genetic Algorithm-Identified Parameters ,” 2025 IEEE 20th Conference on Industrial Electronics and Applications (ICIEA), Yantai, China, 2025, pp. 1-6, doi: 10.1109/ICIEA65512.2025.11149030.
[2] Junya Shao, Mo-Yuen Chow, Zhiping Tan and Huiqin Jin, “Solid Electrolyte Interface Growth Fault Modeling for Battery State of Health Simulation,” 2025 IEEE International Conference on Industrial Technology (ICIT), Wuhan, China, 2025, pp. 1-6, doi: 10.1109/ICIT63637.2025.10965289.
[3] Ziqi Wang, Mo-Yuen Chow, Zhiping Tan and Huiqin Jin, “Modelling of the Solid Electrolyte Interface Growth Using Physics-Based Equivalent Circuit Model,” 2025 IEEE International Conference on Industrial Technology (ICIT), Wuhan, China, 2025, pp. 1-6, doi: 10.1109/ICIT63637.2025.10965250.




